JEDEC JESD9C PDF
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Inspection Criteria for Microelectronic Packages and Covers
| Published by | Publication Date | Number of Pages |
| JEDEC | 05/01/2017 | 82 |
JEDEC JESD9C – Inspection Criteria for Microelectronic Packages and Covers
The purpose of this JEDEC standard is to verify the workmanship and requirements of microelectronic packages and covers (lids) intended for use in fabricating hybrid microelectronic circuits/microcircuits (hereafter referred to as ?microcircuits?). It is applicable for use by the package manufacturer (i.e., package components), and the microcircuit manufacturer (i.e., from incoming inspection of package components through final inspection of the completed microcircuit). This standard also encompasses and replaces JESD27, Ceramic Package Specification for Microelectronic Packages. It is meant to be used in conjunction, and to not contradict, with MIL-STD-883, Test Method 2009: External Visual.
| Published | 05/01/2017 |
|---|---|
| Number of Pages | 82 |
| File Size | 1 file , 2.9 MB |
| Note | This product is unavailable in Russia, Ukraine, Belarus |
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